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Bayesian Analysis ware Reliability Growth Model with Negative Binomial Information
Hee Cheul Kim, Jong Goo Park, Byoung Soo Lee The Transactions of the Korea Information Processing Society (1994 ~ 2000),
Vol. 7, No. 3, pp. 852-861,
Mar.
2000
10.3745/KIPSTE.2000.7.3.852
10.3745/KIPSTE.2000.7.3.852
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